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Field emission Scanning electron microscope (Zeiss, AMRL)
Field emission Scanning electron microscope  (Zeiss, AMRL)
Make: Zeiss
Model: Gemini FESEM 500
Year of purchase: 2019
Funded by: DST, Govt of India
Location: AMRL
Slot timings:
Contact: fesem_amrl@jncasr.ac.in, 080-2208-2014
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  • Filament: FEG filament
  • Resolution: better than 1.2 nm resolution.
  • Accelerating voltage range: 200 V – 30 kV
  • Detectors: In-lens, Secondary electron and EBS, BSD, STEM detector.
  • Secondary electron image,
  • Secondary electron invert image,
  • Backscatter electron image,
  • STEM(HAADF image),
  • EDS-(EDS with atomic weight percentage data, point EDS, Area colour mapping, Line mapping) (Under Maintenance)
  • Cross-section imaging
Modes Duration (hrs)
M1 One hour max 2 samples, Imaging only
M2 1 Hr, Max 1 samples Imaging+EDS Mapping