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Atomic force microscope (Bruker, ICMS)
Atomic force microscope (Bruker, ICMS)
Make: Bruker
Model: Innova
Year of purchase: 2010
Funded by: DST, Govt of India
Location: ICMS
Slot timings:
Contact: maheshji@jncasr.ac.in
Under maintenance
  • Contact Mode AFM & F-Z spectroscopy for topography imaging and force measurements
  • Intermittent Contact Mode AFM
  • Sample types: Thin films, polished solids, dispersed powders on substrates like silicon, HOPG, Au/mica, quartz
  • Sample dimensions: X,Y (max) 20 mm, 35 mm for ambient AFM imaging,
  • Top down multipurpose closed loop large scanner (XY 90μm, Z 8μm),
  • Top down multipurpose open small scanner (XY 9μm, Z 2μm),
  • AFM head with easy laser alignment and high resolution CCD camera
  • Vibration isolation table
  • Nanoscope analysis software for analysis and post-processing images
  • MFM, LFM, EFM, I/V curve are possible.
  • Scanning Tunneling Microscopy
Modes Duration (hrs)
M3. Other modes 1hour per sample (3data)
M1. Contact mode 1 hour per sample(3 Images)
M2. Non Contact (ACAFM) 1 hour per sample(3 images)
Sl. No. - Category Fees ( in Rs/- ) + additional 18% GST
06. Industry for Other- 1hour per sample (3data) Rs 2500 per sample
03. Other Academia for Other- 1hour per sample (3data) Rs 1000 per sample
04. Industry for Contact mode, 1 hour per sample(3 Images) Rs 2500 per sample
01. Other Academia for Contact mode, 1 hour per sample(3 Images) Rs 1000 per sample
05. Industry for Non Contact (ACAFM), 1 hour per sample(3 images) Rs 2500 per sample
02. Other Academia for Non Contact (ACAFM), 1 hour per sample(3 images) Rs 1000 per sample