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Transmission Electron Microscope (JEOL JEM F200)
Transmission Electron Microscope (JEOL JEM F200)
Make: JEOL
Model: JEM F200
Year of purchase: 2024
Funded by: DST, Govt of India
Location: ICMS 108B
Slot timings:
Contact: tem_icms@jncasr.ac.in, 080-2208-2549
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  • • Operating voltage: 200 kV (and 80 kV also on request basis only)
  • • Gun: Cold FEG (energy resolution ~ 0.35 eV)
  • • Resolution (TEM mode) ~ Lattice 0.14 nm and point 0.23 nm
  • • Resolution (STEM mode) ~ 0.16 nm
  • • JEOL low background double tilt holder (± 25°)
  • • JEOL single tilt holder
  • • BF/DF STEM detector
  • • JEOL Sight Sky CMOS camera 19 M pixels (5,688 × 3,336 pixels)
  • • JEOL EDAX EDS detector (dual 100 mm2 with 129 eV energy resolution)
  • • Bright Field Imaging
  • • Dark Field Imaging
  • • Electron Diffraction
  • • EDS in TEM mode (spectrum only)
  • • Scanning Transmission Electron Microscopy (bright field, dark field and HAADF)
  • • EDS point spectrum, line scan and elemental Mapping in STEM mode (Not available, Under maintenance)
Modes Duration (hrs)
M1 HRTEM, SAED, EDS (TEM mode) (1 hrs per slot per sample)
M2 HRTEM, SAED, STEM, EDS Elemental Mapping (2 hrs per slot per sample)
Sl. No. - Category Fees ( in Rs/- ) + additional 18% GST
06. Cost per Carbon coated copper Grid (200 mesh) for Industry Rs 1000
05. Cost per Carbon coated copper Grid (200 mesh) for other academia Rs 500
03. Industry for HRTEM, SAED, EDS (TEM mode) (1 hrs per slot per sample) Rs 5000 per slot
01. Other Academia for HRTEM, SAED, EDS (TEM mode) (1 hrs per slot per sample) Rs 2500 per slot
04. Industry for HRTEM, SAED, STEM, EDS Elemental Mapping (2 hrs per slot per sample) Rs 10000 per slot
02. Other Academia for HRTEM, SAED, STEM, EDS Elemental Mapping (2 hrs per slot per sample) Rs 5000 per slot